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- Newsgroups: comp.lsi.testing
- Path: sparky!uunet!cs.utexas.edu!geraldo.cc.utexas.edu!portal.austin.ibm.com!awdprime.austin.ibm.com!titan.austin.ibm.com!brad
- From: brad@titan.austin.ibm.com (Brad Garton)
- Subject: RE: JTAG
- Sender: news@austin.ibm.com (News id)
- Message-ID: <C187E5.s9F@austin.ibm.com>
- Date: Thu, 21 Jan 1993 22:49:17 GMT
- Reply-To: brad@titan.austin.ibm.com (Brad Garton)
- Organization: IBM Advanced Workstation Division
- Keywords: JTAG
- Lines: 19
-
- I am using JTAG parts from TI, Xilinx and Motorola in a system
- test application.
-
- Don't yet have a lot of experience with JTAG except that
- the costs are still a little hard to justify in extremely
- 1. you are able to do away with somephase of testing ( ICT -
- or some functional)
- 2. I'ts use in the field can be demonstrated to save maintenance costs.
-
- It is still a kind of chicken and egg problem in that without it
- being implemented you are not going to prove 1 or 2.
-
- Can't give out source code, sorry.
-
- Brad
- ___________________________________________________________
- | Brad Garton (512) 838-1333 | brad@titan.austin.ibm.com |
- | I speak for myself not IBM | VNET: GARTON AT AUSTIN |
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