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- Path: sparky!uunet!dtix!darwin.sura.net!spool.mu.edu!vms.csd.mu.edu!5916RAHMANK
- From: 5916rahmank@vms.csd.mu.edu ( )
- Newsgroups: sci.materials
- Subject: Re: TEM samples
- Message-ID: <009657AA.10D74A80@vms.csd.mu.edu>
- Date: 22 Dec 92 23:47:17 GMT
- References: <38005@uflorida.cis.ufl.edu>
- Reply-To: 5916rahmank@vms.csd.mu.edu
- Distribution: usa
- Organization: Department of EECE, Marquette University
- Lines: 25
- NNTP-Posting-Host: vmsf.csd.mu.edu
-
- In article <38005@uflorida.cis.ufl.edu>, sushilb@elm.circa.ufl.edu (Sushil Bharatan) writes:
- >I require information on preparation of cross-sectional TEM samples
- >of a semi-conductor material deposited on 0001 sapphire substrate.
- >I am currently using a dicing saw for cutting strips that are about
- >15 mils in width, but extensive cracking and chipping occur.
- >Any information on dicing saw blade manufacturers and alternative
- >methods is welcome.
- >
- >Thanks,
- >Sushil Bharatan
- >Dept. of Materials Science and Engineering,
- >University of Florida.
- >
- >email:sushilb@elm.circa.ufl
- >
-
- Sushil,
-
- Dicing saw may not be a good thing to use to cut non-metallic
- samples. Instead, you may use a diamond wafering blade with water as
- the cutting fluid. If you are going to make TEM samples, you need
- lot less thicker sample than 15 mil. It is wiser to cut a little
- thicker and then polish it to thin.
-
- -Anis.
-