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Text File  |  1992-12-22  |  836 b   |  24 lines
  1. Newsgroups: sci.materials
  2. Path: sparky!uunet!enterpoop.mit.edu!bloom-picayune.mit.edu!athena.mit.edu!tjdalton
  3. From: tjdalton@athena.mit.edu (Transitive NightFall of Diamonds)
  4. Subject: Polysilicon: Index of Refraction vs. Temp.
  5. Message-ID: <1992Dec21.205044.12955@athena.mit.edu>
  6. Followup-To: sender
  7. Sender: news@athena.mit.edu (News system)
  8. Nntp-Posting-Host: m66-305-1.mit.edu
  9. Organization: Massachusetts Institute of Technology
  10. Date: Mon, 21 Dec 1992 20:50:44 GMT
  11. Lines: 11
  12.  
  13. I'm looking for the index of refraction for polycrystalline silicon
  14. as a function of temperature, in the range of -100C to +50C.
  15. If anyone knows of a reference where I can find this, please email me.
  16.  
  17. Thanks,
  18.  
  19.     Tim
  20.  
  21. ----
  22. Timothy J. Dalton                                   tjdalton@mit.edu
  23. MIT, Dept. of Chemical Engineering, Materials Etching Technology Lab
  24.